The research paper “Health Condition Estimation for Discrete Power Electronic Devices under Package Failure,” with Professor Zhonghai Lu of the Microelectronics Thrust at The Hong Kong University of Science and Technology (Guangzhou) as the first author, received the 2024 IEEE Reliability Society Best Conference Paper Award.
The award was presented at the IEEE/ASQ RAMS-EUROPE international conference held in Trondheim, Norway, in June 2026. Professor Steven Li, President of the IEEE Reliability Society, presented the award at the conference.
This recognition highlights the Microelectronics Thrust’s strong research foundation in power electronic device reliability. Building on HKUST(GZ)’s high-quality research infrastructure and interdisciplinary strengths, the Thrust will continue to address core industrial challenges and pursue original research with both academic and industrial impact, contributing to advances in high-end power semiconductor technologies and the development of microelectronics.
Original report: Xiaohongshu