Zhonghai Lu’s LabArchitectureIntelligenceReliability
NewsResearchProjectsTeamPublicationsAwardsJoin UsContact中文
    • THE 4th INTEGRATED CHIPS AND CHIPLET CONFERENCE Best poster Award
    • PHM-AP 2025 Data Challenge Champion
    • 2024 IEEE Reliability Society Best Conference Paper Award
  • Events
    • AIR Lab
    • 2024 IEEE Reliability Society Best Conference Paper Award
    • Open positions in the lab
    • RESEARCH SEMINAR
  • News
    • Research Seminar: From Predictive to Prescriptive Maintenance with AI and Digital Failure Twins
    • HKUST(GZ) Microelectronics Receives the 2024 IEEE Reliability Society Best Conference Paper Award
    • HKUST(GZ) Microelectronics Team Wins PHM-AP 2025 Data Challenge
    • Digital-Twin-Assisted Hybrid Learning for Endurance Fatigue Prediction of HfZrOx Ferroelectric Diodes
    • Long-Term Health Prediction for Power Diodes Using Non-Uniform Kalman Filter
    • QoS Analysis for UCIe-based Cross-die Communication using Network Calculus
    • RESCUE: Runtime Setup Resilience for TDM-Based Circuit-Switched NoCs
  • Projects
    • Network Composability Issues of Complex Chiplet Integration
  • Join Us
    • PhD Students
    • Postdoctoral Fellows
    • Research Assistants
  • Research
    • Architecture
    • Intelligence
    • Reliability

Open positions in the lab

Jun 15, 2026 · 0 min read
Date
Jun 15, 2026 12:00 AM
events
Last updated on Jun 15, 2026

← 2024 IEEE Reliability Society Best Conference Paper Award Jul 22, 2026
RESEARCH SEMINAR Aug 5, 2026 →
Zhonghai Lu’s LabBack to homepage →